Agilent Technologies ENA Series User manual

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Caution

Do not exceed the operating input power, voltage, and current

level and signal type appropriate for the instrument being used, refer to

your instrument's Function Reference.

Electrostatic discharge(ESD) can damage the highly sensitive

microcircuits in your instrument. ESD damage is most likely to occur as

the test fixtures are being connected or disconnected. Protect them from

ESD damage by wearing a grounding strap that provides a high

resistance path to ground. Alternatively, ground yourself to discharge any

static charge built-up by touching the outer shell of any grounded

instrument chassis before touching the test port connectors.

Safety Summary

When you notice any of the unusual conditions listed below, immediately

terminate operation and disconnect the power cable.

Contact your local Agilent Technologies sales representative or

authorized service company for repair of the instrument. If you continue

to operate without repairing the instrument, there is a potential fire or

shock hazard for the operator.

- Instrument operates abnormally.

- Instrument emits abnormal noise, smell, smoke or a spark-like

light during operation.

- Instrument generates high temperature or electrical shock

during operation.

- Power cable, plug, or receptacle on instrument is damaged.

- Foreign substance or liquid has fallen into the instrument.

Agilent E5070A/E5071A ENA Series RF Network Analyzers

User’s Guide

Second Edition

FIRMWARE REVISIONS

This manual applies directly to instruments that have the firmware revision 2.00.

For additional information about firmware revisions, see Appendix A.

Agilent Part No. E5070-90010

April 2002

Printed in Japan

2

Notices

The information contained in this document is subject to change without notice.

This document contains proprietary information that is protected by copyright. All rights

are reserved. No part of this document may be photocopied, reproduced, or translated to

another language without the prior written consent of Agilent Technologies.

Agilent Technologies Japan, Ltd.

Component Test PGU-Kobe

1-3-2, Murotani, Nishi-ku, Kobe, Hyogo, 651-2241 Japan

ÓCopyright Agilent Technologies Japan, Ltd. 2001, 2002

Portions ÓCopyright 1996, Microsoft Corporation. All rights reserved.

Manual Printing History

The manual’s printing date and part number indicate its current edition. The printing date

changes when a new edition is printed (minor corrections and updates that are incorporated

at reprint do not cause the date to change). The manual part number changes when

extensive technical changes are incorporated.

December 2001 First Edition (part number: E5070-90000)

April 2002 Second Edition (part number: E5070-90010)