Texas Instruments DAC8555EVM User manual

User's GuideSLAU204 – December 2006
DAC8555EVM User's Guide
This user’s guide describes the characteristics, operation and use of the DAC8555Evaluation Module (EVM). It covers all matters related to proper use and configurationof this EVM along with the devices that it supports. The physical printed circuit board(PCB) layout, schematic diagram and circuit descriptions are also included. For a moredetailed description of the DAC8555 , see the product data sheet available from theTexas Instruments web site at http://www.ti.com. Additional support documents arelisted in the section of this guide entitled Related Documentation from TexasInstruments. Throughout this document, the acronym EVM and the phrases evaluationmodule and demonstration board are synonymous with the DAC8555EVM.
TMS320C5000, TMS320C6000 are trademarks of Texas Instruments.LabVIEW is a trademark of National Instruments.
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Contents1 Overview ............................................................................................. 32 PCB Design and Performance .................................................................... 63 EVM Operation .................................................................................... 164 Schematic .......................................................................................... 22
List of Figures
1 DAC8555EVM Functional Block Diagram ....................................................... 52 DAC8555EVM PCB—Top Silkscreen Image ................................................... 73 DAC8555EVM PCB—Layer 1 (Top Signal Layer) ............................................. 74 DAC8555EVM PCB—Layer 2 (Ground Plane) ................................................. 85 DAC8555EVM PCB—Layer 3 (Power Plane) .................................................. 86 DAC8555EVM PCB—Layer 4 (Bottom Signal Layer) ......................................... 97 DAC8555EVM PCB—Bottom Silkscreen Image ............................................... 98 DAC8555EVM—Drill Drawing ................................................................... 109 INL and DNL Characterization Graph of DAC A .............................................. 1110 INL and DNL Characterization Graph of DAC B .............................................. 1211 INL and DNL Characterization Graph of DAC C .............................................. 1312 INL and DNL Characterization Graph of DAC D .............................................. 14
List of Tables
1 DAC8555EVM Parts List ......................................................................... 152 Factory Default Jumper Settings ................................................................ 163 DAC Output Channel Mapping .................................................................. 174 Unity Gain Output Jumper Settings ............................................................. 185 Output Gain of 2 Jumper Settings .............................................................. 186 Capacitive Load Drive Output Jumper Settings ............................................... 197 Jumper Settings and Functions ................................................................. 19
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1 Overview
1.1 Features
1.2 Power Requirements
1.2.1 Supply Voltage
1.2.2 Reference Voltage
Overview
This section gives a general overview of the DAC8555EVM and describes some of the factors that mustbe considered when using this demonstration board.
The DAC8555EVM is a simple evaluation module designed for a quick and easy way to evaluate thefunctionality and performance of the high-resolution, quad-channel, serial input DAC8555 digital-to-analogconverter (DAC). This EVM features a serial interface to communicate with any host microprocessor or TIDSP-based system.
This subsection describes the power requirements for this device.
The DC power supply requirement for the digital section (V
DD
) of this EVM is typically +5V connected tothe J5-1 terminal or via the J3-10 terminal (when plugged in with another EVM board or interface card)and is referenced to ground through the J5-2 and J3-5 terminals. The DC power supply requirements forthe analog section of this EVM are: V
CC
and V
SS
range from +15.75V to –15.75V (maximum), connectingthrough J1-3 and J1-1 respectively, or through terminals J3-1 and J3-2. The +5V
A
connects throughterminals J5-3 or J3-3, and the +3.3V
A
connects through terminal J3-8. All of the analog power suppliesare referenced to analog ground through terminals J1-2 and J3-6.
The analog power supply for the device under test, U1, can be powered by either +5V
A
or +3.3V
A
byselecting the proper position of jumper JMP7. This configuration allows the DAC8555 analog section tooperate from either supply power while the I/O and digital section are powered by +5V, V
DD
.
The V
CC
supply source is primarily used to provide the positive rail of the external output op amp, U2, thereference chip, U3 and the reference buffer, U4. The negative rail of the output op amp, U2, can beselected between V
SS
and AGND via jumper JMP10. The external op amp is installed as an option toprovide output signal conditioning or to boost capacitive load drive, or for other desired output moderequirements.
CAUTION
To avoid potential damage to the EVM board, be sure that the correct cablesare connected to their respective terminals as labeled on the EVM board.Stresses above the maximum listed voltage ratings may cause permanentdamage to the device.
The +5V precision voltage reference is provided to supply the external voltage reference for the DACthrough the REF02 (U3) via jumper JMP8, by shorting pins 1 and 2. The reference voltage goes throughan adjustable 100k Ωpotentiometer, R15, in series with 20k Ω, R16, to allow the user to adjust thereference voltage to its desired settings. The voltage reference is then buffered through U4A as seen bythe device under test. The test points TP2, TP3 and TP4 are also provided, as well as J4-18 and J4-20, inorder to allow the user to connect another external reference source if the onboard reference circuit is notdesired. The external voltage reference should not exceed +5V DC.
The REF02 precision reference is powered by V
CC
(+15V) through either terminal J1-3 or J3-1.
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1.3 EVM Basic Functions
Overview
CAUTION
When applying an external voltage reference through TP2 or J4-20, make surethat it does not exceed +5V maximum. External voltage references in excess of+5V can permanently damage the DAC8555 being tested (U1).
The DAC8555EVM is designed to provide a demonstration platform for testing certain operationalcharacteristics of the DAC8555 digital-to-analog converter. Functional evaluation of the DAC8555 can beaccomplished with the use of any microprocessor, TI DSP or some sort of waveform generator.
Headers J2A (top side) and J2B (bottom side) are pass-through connectors provided to interface a hostprocessor or waveform generator with the DAC8555EVM using a custom-built cable. These connectorsenable the control signals and data to pass between the host and the device.
A mating adapter interface card (5-6k adapter interface) is also available to fit with TI’s TMS320C5000™and TMS320C6000™ DSP Starter Kits (DSKs). This card resolves most of the trouble involved withbuilding a custom cable. Additionally, there is also an MSP430-based platform (HPA449) that uses theMSP430F449 microprocessor, to which this EVM can connect and interface as well. For more details orinformation regarding the 5-6k adapter interface card or the HPA449 platform, please contact your TexasInstruments representative, visit the TI web site or email the Data Converter Applications Support Team at[email protected].
The DAC outputs can be monitored through the selected pins of the J4 header connector. All outputs canbe switched through their respective jumpers—JMP11, JMP12, JMP13 and JMP14—for the purpose ofstacking. Stacking allows a total of eight DAC channels to be used, provided the SYNC signals are uniquefor each EVM board stacked.
In addition, the option of selecting one DAC output that can be fed to the noninverting side of the outputop amp, U2, is also possible by using a jumper across the selected pins of J4. The output op amp (U2)must first be correctly configured for the desired waveform characteristic. For more information, refer toSection 3 of this user’s guide.
A block diagram of the EVM is shown in Figure 1 .
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JMP11
JMP12
JMP13
JMP14
External
Reference
Module
+5VA
VDD
+3.3VA
(J2A)
(J2B)
DAC Module
(J4A)
(J4B) 8 CH
(J1)
(J5)
(J3A)
(J3B)
4 CH
JMP15
JMP16
JMP9
JMP10
DAC Out
VSS
V H
REF
TP4
TP3
VCC
GND
VSS
GND
VDD
+5VA
+3.3VA
DIN
LDAC
SCLK
SYNC
JMP5
JMP6
JMP4 JMP3
JMP8
V H
REF
TP2
VSS
VCC
V L
REF
Output
Buffer
Module
RST RSTSEL
RSTSEL
EN
RST
Overview
Figure 1. DAC8555EVM Functional Block Diagram
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1.3.1 Related Documentation from Texas Instruments
2 PCB Design and Performance
2.1 PCB Layout
PCB Design and Performance
The following documents provide information regarding Texas Instrument integrated circuits used in theassembly of the DAC8555EVM. The latest revisions of these documents are available from the TI web siteat http://www.ti.com.
Data Sheet Literature NumberDAC8555 SLAS475REF02 SBVS003OPA627 SBOS165OPA2132 SBOS054
This section discusses the layout design of the DAC8555EVM PCB, describing the physical andmechanical characteristics of the EVM as well as a brief description of the demonstration board testperformance procedures performed. The list of components used in this evaluation module is alsoincluded.
The DAC8555EVM is designed to preserve the performance quality of the DAC8555, the device undertest (DUT), as specified in the data sheet. In order to take full advantage of the EVM capabilities, use careduring the schematic design phase to properly select the right components and to build the circuitcorrectly. The circuit design should include adequate bypassing, identifying and managing the analog anddigital signals, and understanding the components' electrical and mechanical attributes.
The primary design concerns during the layout process are optimal component placement and propersignal routing. Place the bypass capacitors as close as possible to the device pins, and properly separatethe analog and digital signals from each other. In the layout process, carefully consider the placement ofthe power and ground planes. A solid plane is ideal, but because of its greater cost, a split plane cansometimes be used satisfactorily. When considering a split plane design, analyze the componentplacement and carefully split the board into its analog and digital sections starting from the DUT. Theground plane plays an important role in controlling the noise and other effects that otherwise contribute tothe error of the DAC output. To ensure that the return currents are handled properly, route the appropriatesignals only in their respective sections, meaning that the analog traces should only lay directly above orbelow the analog section and the digital traces in the digital section. Minimize trace length, but use thelargest possible trace width allowable within the design. These design practices are illustrated in Figure 2through Figure 8 .
The DAC8555EVM board is constructed on a four-layer PCB using a copper-clad FR-4 laminate material.The PCB has a dimension of 43,1800mm (1.7000in) by 82,5500mm (3.2500in), and the board thickness is1,5748mm (0.062in). Figure 3 through Figure 7 show the individual artwork layers.
Note: Board layouts are not to scale. These are intended to show how the board is laid out; theyare not intended to be used for manufacturing DAC8555EVM PCBs.
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PCB Design and Performance
Figure 2. DAC8555EVM PCB—Top Silkscreen Image
Figure 3. DAC8555EVM PCB—Layer 1 (Top Signal Layer)
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PCB Design and Performance
Figure 4. DAC8555EVM PCB—Layer 2 (Ground Plane)
Figure 5. DAC8555EVM PCB—Layer 3 (Power Plane)
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PCB Design and Performance
Figure 6. DAC8555EVM PCB—Layer 4 (Bottom Signal Layer)
Figure 7. DAC8555EVM PCB—Bottom Silkscreen Image
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2.2 EVM Performance
PCB Design and Performance
Figure 8. DAC8555EVM—Drill Drawing
The EVM performance test is executed using a high-density DAC bench test board, an Agilent 3458Adigital multimeter and a PC running LabVIEW™ software. The EVM board is tested for linearity for allcodes between 485 and 64741. The DUT is then allowed to settle for 1ms before the meter is read. Thisprocess is repeated for all codes to generate the measurements for INL and DNL.
Results of the DAC8555EVM tests are shown in Figure 9 through Figure 12 .
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