TX5012 Series Operation Manual Ver1.0
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Do not locate the tester in a high-humidity environment—near a boiler, humidifier, or
water supply.
Operating humidity range: 20 % to 80 % RH (no dew condensation permitted)
Storage humidity range: 90 % RH or less (no dew condensation permitted)
Condensation may occur even within the operating humidity range. In that case, do not
start using the tester until the location is completely dry.
Do not locate the tester in a high-humidity environment—near a boiler, humidifier, or
water supply.
Operating humidity range: 20 % to 80 % RH (no dew condensation permitted)
Storage humidity range: 90 % RH or less (no dew condensation permitted)
Condensation may occur even within the operating humidity range. In that case,
do not start using the tester until the location is completely dry.
■ Do not place the tester in a corrosive atmosphere.
Do not install the tester in a corrosive atmosphere or one containing sulfuric acid mist
or the like. This may cause corrosion of various conductors and imperfect contact
with connectors, leading to malfunction and failure, or in the worst case, a fire.
■ Do not locate the tester in a dusty environment.
Dirt and dust in the tester may cause electrical shock or fire.
■ Do not use the tester where ventilation is poor.
This tester features a forced-air cooling system. Provide sufficient space for the air
inlet on the lateral side and the air outlet on the rear side to allow air to flow.
■ Do not place the tester on a tilted surface or in a location subject
to vibrations.
If placed on a non-level surface or in a location subject to vibration, the tester may fall,
resulting in damage and injury.
■ Do not use the tester in locations affected by strong magnetic or
electric fields.
Operation in a location subject to magnetic or electric fields may cause the tester to
malfunction, resulting in electrical shock or fire.
■ Do not use the tester in locations near a sensitive test instrument
or receiver
Operation in a location subject, may cause such equipment may be affected by noise
generated by the tester.